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Introduction to EMI/EMC Design for Printed Circuit Boards |
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1 | (8) |
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1 | (3) |
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4 | (1) |
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5 | (1) |
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6 | (1) |
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6 | (1) |
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7 | (2) |
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9 | (16) |
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9 | (1) |
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10 | (4) |
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10 | (2) |
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12 | (2) |
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14 | (5) |
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Clock Signals Harmonic Frequencies |
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14 | (3) |
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Hertz vs. Bits-per-Second |
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17 | (1) |
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Non-Squarewave Data Signals |
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18 | (1) |
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19 | (2) |
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20 | (1) |
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Potential Emissions Sources |
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21 | (2) |
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21 | (1) |
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22 | (1) |
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Intentional Signal Content |
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23 | (1) |
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23 | (2) |
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25 | (18) |
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25 | (1) |
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Electromagnetic Induction |
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25 | (2) |
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27 | (2) |
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29 | (7) |
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Self-Inductance per Unit Length |
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33 | (3) |
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36 | (4) |
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40 | (3) |
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43 | (26) |
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Where Did The Term ``Ground'' Originate? |
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43 | (3) |
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What Do We Mean When We Say ``Ground''? |
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46 | (9) |
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46 | (3) |
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49 | (1) |
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50 | (1) |
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51 | (3) |
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54 | (1) |
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55 | (1) |
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`Ground' is Not a Current Sink |
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55 | (1) |
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55 | (3) |
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Single-Point Ground-Reference Strategy |
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56 | (1) |
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Multi-Point Ground-Reference Strategy |
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56 | (2) |
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Grounding Heatsinks to PC boards |
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58 | (6) |
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Heatsink ``Grounding'' Example |
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61 | (3) |
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PCB Reference Connection to Chassis Reference |
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64 | (2) |
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64 | (2) |
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66 | (3) |
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69 | (16) |
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69 | (2) |
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71 | (5) |
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72 | (4) |
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Trace Changing Reference Planes |
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76 | (4) |
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Motherboards and Daughter Cards |
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80 | (3) |
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Connector Pin Assignments |
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82 | (1) |
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83 | (2) |
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Controlling EMI Sources -- Intentional Signals |
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85 | (20) |
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85 | (1) |
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86 | (1) |
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86 | (7) |
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Intentional Signals -- Loop-Mode |
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93 | (2) |
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Controlling Emissions from Intentional Signals -- Loop-Mode |
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95 | (1) |
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Intentional Signals -- Common-mode |
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96 | (3) |
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Intentional Signals -- Common-mode with Interrupted Return Path |
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99 | (3) |
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Critical Signal Traces Crossing Splits |
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99 | (1) |
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Critical Signals Through Vias |
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100 | (2) |
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102 | (3) |
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Controlling EMI Sources -- Unintentional Signals |
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105 | (16) |
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105 | (1) |
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106 | (1) |
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Unintentional Signals -- Common-mode |
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106 | (2) |
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Controlling Emissions from Unintentional Signals -- Common-mode |
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108 | (5) |
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Unintentional Signals -- `Crosstalk' Coupling onto I/O Lines |
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113 | (2) |
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Controlling Emissions from Unintentional Signals -- `Crosstalk' Coupling to I/O Lines |
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115 | (3) |
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118 | (3) |
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Decoupling Power/Ground Planes |
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121 | (30) |
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121 | (1) |
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122 | (2) |
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Calculating the Source of Decoupling Noise |
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124 | (6) |
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Decoupling Noise from ASIC/ICs power pins |
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124 | (6) |
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Decoupling Capacitor Effectiveness |
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130 | (18) |
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131 | (3) |
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Empty Test Board Configuration |
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134 | (2) |
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Quantity of Distributed (Global) Decoupling Capacitors (.0luf Only) |
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136 | (1) |
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Quantity of Distributed Decoupling Capacitors (0.0luf and 330 pF) |
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137 | (3) |
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Selecting the Value of the Decoupling Capacitors |
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140 | (1) |
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Perfect Decoupling Capacitors |
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140 | (1) |
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Source Vs Distributed Decoupling |
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141 | (3) |
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Buried Capacitance Decoupling |
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144 | (2) |
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146 | (2) |
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148 | (3) |
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151 | (20) |
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151 | (1) |
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151 | (4) |
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155 | (8) |
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Two-Component Filter Configurations |
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155 | (2) |
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Reference Connection for Two-Component Filters |
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157 | (4) |
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Three Component Filter Configurations |
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161 | (2) |
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Single Component Filter Configurations |
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163 | (1) |
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Non-Ideal Components and the Impact on Filters |
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163 | (5) |
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164 | (2) |
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166 | (2) |
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Non-Ideal Zero Ohm Resistors |
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168 | (1) |
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168 | (1) |
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169 | (2) |
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Using Signal Integrity Tools for EMC Analysis |
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171 | (16) |
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171 | (1) |
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Intentional Current Spectrum |
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172 | (5) |
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Trace Current for Decoupling Analysis |
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177 | (2) |
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Differential Signals Analysis |
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179 | (6) |
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Internal Differential Signal Lines |
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181 | (1) |
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External I/O Differential Signal Lines |
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182 | (3) |
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185 | (1) |
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185 | (2) |
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Printed Circuit Board Layout |
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187 | (12) |
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187 | (1) |
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187 | (8) |
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188 | (3) |
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191 | (1) |
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192 | (1) |
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193 | (2) |
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195 | (1) |
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195 | (1) |
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196 | (3) |
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Shielding in Enclosures with Apertures |
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199 | (22) |
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199 | (3) |
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Resonance Mode within Shielded Enclosures |
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202 | (6) |
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208 | (5) |
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208 | (2) |
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210 | (3) |
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Predicting the Shielding Effectiveness of Enclosures with Apertures |
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213 | (2) |
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Shielding the PC Board Edge |
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215 | (1) |
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216 | (2) |
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218 | (3) |
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What To Do If a Product Fails in the EMC Lab |
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221 | (10) |
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221 | (1) |
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Where Does the Signal Come From? |
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222 | (1) |
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How Does the Signal Get Out of the Shielded Enclosure? |
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223 | (4) |
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Leaks through slots holes and apertures |
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223 | (2) |
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Conducted through the shield on cables and wires |
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225 | (1) |
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Leaks from imperfect mating of shielded cable shields to the enclosure |
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226 | (1) |
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227 | (2) |
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Case 1 Clock signal leaking from seam |
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228 | (1) |
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Case 2 Clock signal leaking from an unshielded cable |
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228 | (1) |
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229 | (2) |
Appendix A Introduction to EMI/EMC Computational Modeling |
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231 | (10) |
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231 | (1) |
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A.2 Why Is EMI/EMC Modeling Important? |
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232 | (1) |
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A.3 EMI/EMC Modeling: State of the Art |
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233 | (1) |
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234 | (1) |
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A.5 Brief Description of EMI Modeling Techniques |
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235 | (4) |
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A.5.1 Finite Difference Time-Domain |
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235 | (2) |
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237 | (1) |
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A.5.3 Finite Element Method |
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238 | (1) |
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A.6. Other Uses for Electromagnetic Modeling |
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239 | (1) |
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239 | (2) |
Index |
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241 | |